SAE Technical Paper Series [SAE International SAE World Congress & Exhibition - (APR. 20, 2009)] SAE Technical Paper Series - Bayesian Technique for Reducing Uncertainty in Fatigue Failure Model
- 作者Pattabhiraman, Sriram; Kim, Nam H.
- 卷第1卷
- 印刷ISSNArra-y
- 文件大小139.97KB
- 发表时间2009
- DOI10.4271/2009-01-0560
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