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Reliability Wearout Mechanisms in Advanced CMOS Technologies ||

Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D.

作者Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D.
文件大小21611.26KB
发表时间2009
DOI10.1002/9780470455265