[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - High resolution led-spectroscopy for sensor application in harsh environment
Degner, M.; Damaschke, N.; Ewald, H.; Lewis, E.
- 作者Degner, M.; Damaschke, N.; Ewald, H.; Lewis, E.
- 文件大小744.86KB
- 发表时间2010
- DOI10.1109/imtc.2010.5488239
- 页码1382-1386