Microstructure of epitaxial strained BiCrO3 thin films
David, A.; Boullay, Ph.; Mangalam, R. V. K.; Barrier, N.; Prellier, W.
- 作者David, A.; Boullay, Ph.; Mangalam, R. V. K.; Barrier, N.; Prellier, W.
- 卷第96卷
- 期第22期
- 文件大小1709.64KB
- 发表时间2010
- DOI10.1063/1.3435486