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[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Reliable MLC NAND flash memories based on nonlinear t-error-correcting codes

[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Reliable MLC NAND flash memories based on nonlinear t-error-correcting codes

Wang, Zhen; Karpovsky, Mark; Joshi, Ajay

作者Wang, Zhen; Karpovsky, Mark; Joshi, Ajay
文件大小1076.59KB
发表时间2010
DOI10.1109/DSN.2010.5545014
页码41-50

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