![SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Adaptive holographic illumination in comparative electronic speckle pattern interferometry]()
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Adaptive holographic illumination in comparative electronic speckle pattern interferometrySéfel, Richárd; Lehmann, Peter H.; Osten, Wolfgang; Kornis, János; Varga-Fogarasi, Szilvia; Gastinger, Kay · 2011