发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Modeling and metrology of metallic nanowires with application to microwave interconnects

[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Modeling and metrology of metallic nanowires with application to microwave interconnects

Kim, Kichul; Wallis, T. Mitch; Rice, Paul; Chiang, Chin-Jen; Imtiaz, Atif; Kabos, Pavel; Filipovic, Dejan S.

作者Kim, Kichul; Wallis, T. Mitch; Rice, Paul; Chiang, Chin-Jen; Imtiaz, Atif; Kabos, Pavel; Filipovic, Dejan S.
文件大小3241.38KB
发表时间2010
DOI10.1109/MWSYM.2010.5518053
页码1292-1295

← 返回【学霸图书馆】主页