Charge Enhancement Effects in 6H-SiC MOSFETs Induced by Heavy Ion Strike
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Onoda, Shinobu; Makino, Takahiro; Iwamoto, Naoya; Vizkelethy, Gyorgy; Kojima, Kazutoshi; Nozaki, Shinji; Ohshima, Takeshi
- 印刷ISSN0018-9499
- 文件大小437.98KB
- 发表时间2010-12
- DOI10.1109/TNS.2010.2070076
[IEEE 2012 IEEE International Conference on Power System Technology (POWERCON 2012) - Auckland (2012.10.30-2012.11.2)] 2012 IEEE International Conference on Power System Technology (POWERCON) - [Front cover]2012
[IEEE 2012 IEEE International Conference on Power System Technology (POWERCON 2012) - Auckland (2012.10.30-2012.11.2)] 2012 IEEE International Conference on Power System Technology (POWERCON) - Author index2012
[IEEE 2012 IEEE International Conference on Power System Technology (POWERCON 2012) - Auckland (2012.10.30-2012.11.2)] 2012 IEEE International Conference on Power System Technology (POWERCON) - Local organising committee2012
[IEEE 2012 IEEE International Conference on Power System Technology (POWERCON 2012) - Auckland (2012.10.30-2012.11.2)] 2012 IEEE International Conference on Power System Technology (POWERCON) - Table of contents2012
[IEEE 2012 IEEE International Conference on Power and Energy (PECon) - Kota Kinabalu, Malaysia (2012.12.2-2012.12.5)] 2012 IEEE International Conference on Power and Energy (PECon) - Reviewers2012
[IEEE 2012 IEEE International Conference on Power and Energy (PECon) - Kota Kinabalu, Malaysia (2012.12.2-2012.12.5)] 2012 IEEE International Conference on Power and Energy (PECon) - Content2012
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