[IEEE 2010 17th Working Conference on Reverse Engineering (WCRE) - Beverly, MA, USA (2010.10.13-2010.10.16)] 2010 17th Working Conference on Reverse Engineering - Understanding Feature Evolution in a Family of Product Variants
Xue, Yinxing; Xing, Zhenchang; Jarzabek, Stan
- 作者Xue, Yinxing; Xing, Zhenchang; Jarzabek, Stan
- 文件大小292.41KB
- 发表时间2010
- DOI10.1109/WCRE.2010.20
- 页码109-118