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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A diagnostic test generation system

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A diagnostic test generation system

Zhang, Yu; Agrawal, Vishwani D.

作者Zhang, Yu; Agrawal, Vishwani D.
文件大小1396.28KB
发表时间2010
DOI10.1109/test.2010.5699237
页码1-9

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