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[IEEE 2010 2nd Asia Symposium on Quality Electronic Design (ASQED 2010) - Penang, Malaysia (2010.08.3-2010.08.4)] 2nd Asia Symposium on Quality Electronic Design (ASQED) - A case study of Short Term Cell-Flipping technique for mitigating NBTI degradation on cache

[IEEE 2010 2nd Asia Symposium on Quality Electronic Design (ASQED 2010) - Penang, Malaysia (2010.08.3-2010.08.4)] 2nd Asia Symposium on Quality Electronic Design (ASQED) - A case study of Short Term Cell-Flipping technique for mitigating NBTI degradation on cache

Kunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto

作者Kunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto
文件大小2413.63KB
发表时间2010
DOI10.1109/asqed.2010.5548256
页码301-307

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