Multilayer nano-thickness measurement by a portable low-power Bremsstrahlung X-ray reflectometer
- 期刊名称Analytical Methods
- 作者Alshehabi, Abbas; Kunimura, Shinsuke; Kawai, Jun
- 卷第2卷
- 期第10期
- 印刷ISSN1759-9660
- 电子ISSN1759-9679
- 文件大小247.35KB
- 发表时间2010
- DOI10.1039/c0ay00216j
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