[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Analyzing DAC waveform distortion due to finite settling time
- 作者D'Apuzzo, Massimo; D'Arco, Mauro; Liccardo, Annalisa; Vadursi, Michele
- 文件大小671.66KB
- 发表时间2010
- DOI10.1109/imtc.2010.5488037
- 页码352-356
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