[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Adapting to adaptive testing
Marinissen, Erik Jan; Singh, Adit; Glotter, Dan; Esposito, Marco; Carulli, John M; Nahar, Amit; Butler, Kenneth M; Appello, Davide; Portelli, Chris
- 作者Marinissen, Erik Jan; Singh, Adit; Glotter, Dan; Esposito, Marco; Carulli, John M; Nahar, Amit; Butler, Kenneth M; Appello, Davide; Portelli, Chris
- 文件大小605.25KB
- 发表时间2010
- DOI10.1109/date.2010.5457143
- 页码556-561