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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Voltage traceability of Johnson noise thermometry by ac-dc transfer method

[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Voltage traceability of Johnson noise thermometry by ac-dc transfer method

Manta, F.; Callegaro, L.; Pisani, M.; Ortolano, M.; D'Elia, V.

作者Manta, F.; Callegaro, L.; Pisani, M.; Ortolano, M.; D'Elia, V.
文件大小168.46KB
发表时间2010
DOI10.1109/cpem.2010.5543227
页码72-73

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