Optimizing Scrubbing Sequences for Advanced Computer Memories
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Reviriego, Pedro; Maestro, Juan Antonio; Sanghyeon Baeg,
- 卷第10卷
- 期第2期
- 印刷ISSN1530-4388
- 电子ISSN1558-2574
- 文件大小1349.28KB
- 发表时间2010-06
- DOI10.1109/tdmr.2009.2039481
- 页码192-200
[IEEE 2013 20th International Symposium on Temporal Representation and Reasoning (TIME) - Pensacola, FL, USA (2013.09.26-2013.09.28)] 2013 20th International Symposium on Temporal Representation and Reasoning - Reviewers2013
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