[IEEE 2010 2nd International Workshop on Database Technology and Applications (DBTA) - Wuhan, China (2010.11.27-2010.11.28)] 2010 2nd International Workshop on Database Technology and Applications - The Identification of Internal and External Faults for ±800kV UHVDC Transmission Line Based on Using Wavelet Based Multi-Resolution Analysis
Shu, Hongchun; Tian, Xincui; Dai, Yuetao
- 作者Shu, Hongchun; Tian, Xincui; Dai, Yuetao
- 文件大小270.41KB
- 发表时间2010
- DOI10.1109/dbta.2010.5658965
- 页码1-4