‘Dreadful Beyond Description’
- 期刊名称European Journal of English Studies
- 作者Schwan, Anne
- 卷第14卷
- 期第2期
- 印刷ISSN1382-5577
- 电子ISSN1744-4233
- 文件大小140.11KB
- 发表时间2010-08
- DOI10.1080/13825577.2010.481450
- 页码107-120
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Why Photomultiplier Tube?Hiruma, T. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Development of field emission displayItoh, S.; Tanaka, M.; Tonegawa, T. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Electron emission of carbon nanonetsWang Weibiao, ; Xia Yuxue, ; Zhang Chuanping, · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Organic TFT controlled organic field emitterKymissis, I.; Akinwande, A.I. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Field emission from carbon nanotube matZhao, W.J.; Wasu, R.; Takai, M. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - MOLD type multifunctional FEA/SNOM deviceDziuban, J.; Gorecka-Drzazga, A.; Bargiel, S. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Emission characteristics of NbC/Nb field emittersCharbonnier, F.; Southall, L.; Mackie, A. · 2003
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Electron emission from diamond tube arraysGu, C.Z.; Liu, W.; Jin, A.Z.; Dou, Y. · 2003