Improved Resistive Switching Reliability in Graded NiO Multilayer for Resistive Nonvolatile Memory Devices
Myoung-Jae Lee, ; Chang Bum Lee, ; Dongsoo Lee, ; Seung Ryul Lee, ; Jihyun Hur, ; Seung-Eon Ahn, ; Man Chang, ; Young-Bae Kim, ; U-In Chung, ; Chang-Jung Kim, ; Dong-Sik Kim, ; Hosun Lee,
- 期刊名称IEEE Electron Device Letters
- 作者Myoung-Jae Lee, ; Chang Bum Lee, ; Dongsoo Lee, ; Seung Ryul Lee, ; Jihyun Hur, ; Seung-Eon Ahn, ; Man Chang, ; Young-Bae Kim, ; U-In Chung, ; Chang-Jung Kim, ; Dong-Sik Kim, ; Hosun Lee,
- 卷第31卷
- 期第7期
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小304.39KB
- 发表时间2010-07
- DOI10.1109/led.2010.2048886
- 页码725-727