发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

Madl, M; Brezna, W; Klang, P; Andrews, A M; Strasser, G; Smoliner, J

期刊名称Semiconductor Science and Technology
作者Madl, M; Brezna, W; Klang, P; Andrews, A M; Strasser, G; Smoliner, J
卷第25卷
期第6期
印刷ISSN0268-1242
电子ISSN1361-6641
文件大小565.55KB
发表时间2010-06-01
DOI10.1088/0268-1242/25/6/065010

← 返回【学霸图书馆】主页