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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applications

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applications

Liu, Wen; Liou, Juin J.; You Li, ; Chung, J.; Jeong, Y. H.
  • 作者Liu, Wen; Liou, Juin J.; You Li, ; Chung, J.; Jeong, Y. H.
  • 文件大小431.39KB
  • 发表时间2010
  • DOI10.1109/ipfa.2010.5532007
  • 页码1-5
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