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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface

Wang, Szu-Yu; Lue, Hang-Ting; Hsu, Tzu-Hsuan; Du, Pei-Ying; Lai, Sheng-Chih; Hsiao, Yi-Hsuan; Hong, Shih-Ping; Wu, Ming-Tsung; Hsu, Fang-Hao; Lian, Nan-Tzu; Lu, Chi-Pin; Hsieh, Jung-Yu; Yang, Ling-Wu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Lu, Chih-Yuan
  • 作者Wang, Szu-Yu; Lue, Hang-Ting; Hsu, Tzu-Hsuan; Du, Pei-Ying; Lai, Sheng-Chih; Hsiao, Yi-Hsuan; Hong, Shih-Ping; Wu, Ming-Tsung; Hsu, Fang-Hao; Lian, Nan-Tzu; Lu, Chi-Pin; Hsieh, Jung-Yu; Yang, Ling-Wu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Lu, Chih-Yuan
  • 文件大小439.36KB
  • 发表时间2010
  • DOI10.1109/irps.2010.5488698
  • 页码951-955
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