Polarimetric performance of Si/CdTe semiconductor Compton camera
Shin’ichiro Takeda; Hirokazu Odaka; Junichiro Katsuta; Shin-nosuke Ishikawa; So-ichiro Sugimoto; Yuu Koseki; Shin Watanabe; Goro Sato; Motohide Kokubun; Tadayuki Takahashi; Kazuhiro Nakazawa; Yasushi Fukazawa; Hiroyasu Tajima; Hidenori Toyokawa
- 作者Shin’ichiro Takeda; Hirokazu Odaka; Junichiro Katsuta; Shin-nosuke Ishikawa; So-ichiro Sugimoto; Yuu Koseki; Shin Watanabe; Goro Sato; Motohide Kokubun; Tadayuki Takahashi; Kazuhiro Nakazawa; Yasushi Fukazawa; Hiroyasu Tajima; Hidenori Toyokawa
- 卷第622卷
- 期第3期
- 印刷ISSN0168-9002
- 文件大小772.00KB
- 发表时间2010
- DOI10.1016/j.nima.2010.07.077
- 页码619-627