发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Rapid FPGA delay characterization using clock synthesis and sparse sampling

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Rapid FPGA delay characterization using clock synthesis and sparse sampling

Majzoobi, Mehrdad; Dyer, Eva; Elnably, Ahmed; Koushanfar, Farinaz

作者Majzoobi, Mehrdad; Dyer, Eva; Elnably, Ahmed; Koushanfar, Farinaz
文件大小2213.95KB
发表时间2010
DOI10.1109/test.2010.5699248
页码1-10

← 返回【学霸图书馆】主页