Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling

• 作者N.P. Barradas; R. Mateus; M. Fonseca; M.A. Reis; K. Lorenz; I. Vickridge
• 卷第268卷
• 印刷ISSN0168-583X
• 文件大小352.20KB
• 发表时间2010
• DOI10.1016/j.nimb.2010.02.092
• 页码1829-1832