[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Robust high current ESD performance of nano-meter scale DeNMOS by source ballasting
Chatterjee, Amitabh; Brewer, Forrest; Gossner, Harald; Pendharkar, Sameer; Duvvury, Charvaka
- 作者Chatterjee, Amitabh; Brewer, Forrest; Gossner, Harald; Pendharkar, Sameer; Duvvury, Charvaka
- 文件大小862.35KB
- 发表时间2010
- DOI10.1109/irps.2010.5488721
- 页码853-856