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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A low-cost ATE phase signal generation technique for test applications

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A low-cost ATE phase signal generation technique for test applications

Aouini, Sadok; Chuai, Kun; Roberts, Gordon W.

作者Aouini, Sadok; Chuai, Kun; Roberts, Gordon W.
文件大小2573.18KB
发表时间2010
DOI10.1109/test.2010.5699202
页码1-10

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