[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Concurrent test planning
- 作者Van Wagenen, Bethany; Seng, Edward
- 文件大小377.47KB
- 发表时间2010
- DOI10.1109/test.2010.5699255
- 页码1-10
[IEEE Proceedings of 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (1994.06.29-1994.07.1)] Proceedings of 1994 American Control Conference - ACC 94 ACC-94 - 1994 American Control Conference1994
[IEEE Proceedings of 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (1994.6.29-1994.7.1)] Proceedings of 1994 American Control Conference - ACC '94 - Proceedings of 1994 American Control Conference - ACC '941994
[IEEE Proceedings of 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (1994.6.29-1994.7.1)] Proceedings of 1994 American Control Conference - ACC '94 - 1994 American Control Conference1994
[IEEE Proceedings of 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (1994.6.29-1994.7.1)] Proceedings of 1994 American Control Conference - ACC '94 - 1994 American Control Conference1994
[IEEE 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (29 June-1 July 1994)] Proceedings of 1994 American Control Conference - ACC '94 - Optimal decentralized controlSavastuk, S.K.; Siljak, D.D. · 1994
[IEEE 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (29 June-1 July 1994)] Proceedings of 1994 American Control Conference - ACC '94 - Reliable decentralized controlGundes, A.N.; Kabuli, M.G. · 1994
[IEEE 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (29 June-1 July 1994)] Proceedings of 1994 American Control Conference - ACC '94 - Identified predictive controlBialasiewicz, J.T.; Horta, L.G.; Phan, M.Q. · 1994
[IEEE 1994 American Control Conference - ACC '94 - Baltimore, MD, USA (29 June-1 July 1994)] Proceedings of 1994 American Control Conference - ACC '94 - Learning feedforward controlTao, K.M.; Kosut, R.L.; Aral, G. · 1994