发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Reliability analysis of analog circuits by lifetime yield prediction using worst-case distance degradation rate

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Reliability analysis of analog circuits by lifetime yield prediction using worst-case distance degradation rate

Pan, Xin; Graeb, Helmut

作者Pan, Xin; Graeb, Helmut
文件大小219.80KB
发表时间2010
DOI10.1109/ISQED.2010.5450477
页码861-865

← 返回【学霸图书馆】主页