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Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods

Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods

Ueta, Genyo; Tsuboi, Toshihiro; Takami, Jun; Okabe, Shigemitsu; Hirose, Hideo
  • 期刊名称IEEE Transactions on Dielectrics and Electrical Insulation
  • 作者Ueta, Genyo; Tsuboi, Toshihiro; Takami, Jun; Okabe, Shigemitsu; Hirose, Hideo
  • 卷第17卷
  • 期第4期
  • 印刷ISSN1070-9878
  • 文件大小1166.92KB
  • 发表时间2010-08
  • DOI10.1109/tdei.2010.5539706
  • 页码1336-1345
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