Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods
Ueta, Genyo; Tsuboi, Toshihiro; Takami, Jun; Okabe, Shigemitsu; Hirose, Hideo
- 期刊名称IEEE Transactions on Dielectrics and Electrical Insulation
- 作者Ueta, Genyo; Tsuboi, Toshihiro; Takami, Jun; Okabe, Shigemitsu; Hirose, Hideo
- 卷第17卷
- 期第4期
- 印刷ISSN1070-9878
- 文件大小1166.92KB
- 发表时间2010-08
- DOI10.1109/tdei.2010.5539706
- 页码1336-1345