[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Using of AM and FM signal for ADC testing
- 作者Vedral, Josef; Fexa, Pavel; Svatos, Jakub
- 文件大小652.88KB
- 发表时间2010
- DOI10.1109/imtc.2010.5488235
- 页码508-511
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