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[IEEE 2010 American Control Conference (ACC 2010) - Baltimore, MD (2010.6.30-2010.7.2)] Proceedings of the 2010 American Control Conference - Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage

[IEEE 2010 American Control Conference (ACC 2010) - Baltimore, MD (2010.6.30-2010.7.2)] Proceedings of the 2010 American Control Conference - Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage

van Herpen, Robbert; Oomen, Tom; van de Wal, Marc; Bosgra, Okko

作者van Herpen, Robbert; Oomen, Tom; van de Wal, Marc; Bosgra, Okko
文件大小1781.37KB
发表时间2010
DOI10.1109/acc.2010.5530866
页码3493-3499

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