Optical and structural characterization of AlInN layers for optoelectronic applications
- 期刊名称Journal of Applied Physics
- 作者Aschenbrenner, T.; Dartsch, H.; Kruse, C.; Anastasescu, M.; Stoica, M.; Gartner, M.; Pretorius, A.; Rosenauer, A.; Wagner, Thomas; Hommel, D.
- 卷第108卷
- 期第6期
- 印刷ISSN0021-8979
- 文件大小4039.54KB
- 发表时间2010
- DOI10.1063/1.3467964
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