Dependence of film surface roughness and slope on surface migration and lattice size in thin film deposition processes
- 作者Jianqiao Huang; Gangshi Hu; Gerassimos Orkoulas; Panagiotis D. Christofides
- 卷第65卷
- 期第23期
- 印刷ISSN0009-2509
- 文件大小673.48KB
- 发表时间2010
- DOI10.1016/j.ces.2010.08.035
- 页码6101-6111
Dynamics and Lattice-Size Dependence of Surface Mean Slope in Thin-Film DepositionHuang, Jianqiao; Hu, Gangshi; Orkoulas, Gerassimos; Christofides, Panagiotis D. · Industrial & Engineering Chemistry Research · 2011
Controlling aggregate thin film surface morphology for improved light trapping using a patterned deposition rate profileXinyu Zhang; Jianqiao Huang; Gangshi Hu; Gerassimos Orkoulas; Panagiotis D. Christofides · 2012
Lattice-size Dependence and Dynamics of Surface Mean Slope in a Thin Film Deposition ProcessHuang, Jianqiao; Hu, Gangshi; Orkoulas, Gerassimos; Christofides, Panagiotis D. · IFAC Proceedings Volumes · 2010
Investigation of film surface roughness and porosity dependence on lattice size in a porous thin film deposition processHu, Gangshi; Huang, Jianqiao; Orkoulas, Gerassimos; Christofides, Panagiotis D. · Physical Review E · 2009
[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Dependence of film surface roughness on surface migration and lattice size in thin film depositionJianqiao Huang, ; Gangshi Hu, ; Orkoulas, Gerassimos; Christofides, Panagiotis D. · 2011