[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - On the charging and thermal characterization of a micro/nano structured thermal ground plane
de Bock, H. Peter J.; Chauhan, Shakti; Chamarthy, Pramod; Weaver, Stanton E.; Deng, Tao; Gerner, Frank M.; Ababneh, Mohammed T.; Varanasi, Kripa
- 作者de Bock, H. Peter J.; Chauhan, Shakti; Chamarthy, Pramod; Weaver, Stanton E.; Deng, Tao; Gerner, Frank M.; Ababneh, Mohammed T.; Varanasi, Kripa
- 文件大小426.27KB
- 发表时间2010
- DOI10.1109/itherm.2010.5501325
- 页码1-6