SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Aspheric surface testing by irradiance transport equation
- 作者Shomali, Ramin; Darudi, Ahmad; Nasiri, Sadollah; Asgharsharghi Bonab, Armir; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy
- 卷第7656卷
- 印刷ISSN0277-786X
- 文件大小284.93KB
- 发表时间2010
- DOI10.1117/12.865591
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