Self-Similarity of Electrochemically-Deposited Copper Films on Porous Silicon
- 期刊名称Key Engineering Materials
- 作者Chen, Lan Li; Zhai, Bao Gai; Huang, Yuan Ming
- 电子ISSN1662-9795
- 文件大小1024.35KB
- 发表时间2010-1
- DOI10.4028/www.scientific.net/kem.428-429.515
- 页码515-518
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