AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON PHYSICS OF EMERGING FUNCTIONAL MATERIALS (PEFM-2010) - Mumbai, (India) (22–24 September 2010)] - High Resolution X-ray Microscopy For Nano-Resolution Imaging
Kashyap, Y. S.; Agrawal, A.; Sarkar, P. S.; Shukla, Mayank; Roy, T.; Sinha, Amar; Aswal, Dinesh K.; Debnath, Anil K.
- 作者Kashyap, Y. S.; Agrawal, A.; Sarkar, P. S.; Shukla, Mayank; Roy, T.; Sinha, Amar; Aswal, Dinesh K.; Debnath, Anil K.
- 印刷ISSN0094-243X
- 文件大小131.94KB
- 发表时间2010
- DOI10.1063/1.3530473
- 页码149-151