[ACM Press the 2010 ACM-IEEE International Symposium - Bolzano-Bozen, Italy (2010.09.16-2010.09.17)] Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10 - An event-based empirical process analysis framework

• 作者Sunindyo, Wikan Danar; Biffl, Stefan; Mordinyi, Richard; Moser, Thomas; Schatten, Alexander; Tabatabai, Mohammed; Wahyudin, Dindin; Weippl, Edgar; Winkler, Dietmar
• 文件大小189.31KB
• 发表时间2010
• DOI10.1145/1852786.1852867