SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Silicon Photonics V - Microfluidic-based detection platform for on-the-flow analyte characterization

• 作者Kiesel, Peter; Kubby, Joel A.; Reed, Graham T.; Beck, Markus; Johnson, Noble; Bassler, Michael
• 卷第7606卷
• 印刷ISSN0277-786X
• 文件大小632.20KB
• 发表时间2010
• DOI10.1117/12.840564