SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon - A new single-photon avalanche diode in 90nm standard CMOS technology
Dereniak, Eustace L.; Karami, Mohammad Azim; Gersbach, Marek; Hartke, John P.; LeVan, Paul D.; Charbon, Edoardo; Sood, Ashok K.; Longshore, Randolph E.; Razeghi, Manijeh
- 作者Dereniak, Eustace L.; Karami, Mohammad Azim; Gersbach, Marek; Hartke, John P.; LeVan, Paul D.; Charbon, Edoardo; Sood, Ashok K.; Longshore, Randolph E.; Razeghi, Manijeh
- 卷第7780卷
- 印刷ISSN0277-786X
- 文件大小630.50KB
- 发表时间2010
- DOI10.1117/12.859435