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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis of the optical characteristic of particles by the discrete dipole approximation method

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis of the optical characteristic of particles by the discrete dipole approximation method

Li, Qing; Zhang, Yudong; Sasián, José; Zhang, Guoping; Liu, Yang; Xiang, Libin; To, Sandy
  • 作者Li, Qing; Zhang, Yudong; Sasián, José; Zhang, Guoping; Liu, Yang; Xiang, Libin; To, Sandy
  • 卷第7656卷
  • 印刷ISSN0277-786X
  • 文件大小309.72KB
  • 发表时间2010
  • DOI10.1117/12.863846
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