SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis of the optical characteristic of particles by the discrete dipole approximation method
Li, Qing; Zhang, Yudong; Sasián, José; Zhang, Guoping; Liu, Yang; Xiang, Libin; To, Sandy
- 作者Li, Qing; Zhang, Yudong; Sasián, José; Zhang, Guoping; Liu, Yang; Xiang, Libin; To, Sandy
- 卷第7656卷
- 印刷ISSN0277-786X
- 文件大小309.72KB
- 发表时间2010
- DOI10.1117/12.863846