SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon - Single-photon Imaging in CMOS
- 作者Charbon, E.; Dereniak, Eustace L.; Hartke, John P.; LeVan, Paul D.; Sood, Ashok K.; Longshore, Randolph E.; Razeghi, Manijeh
- 卷第7780卷
- 印刷ISSN0277-786X
- 文件大小6787.05KB
- 发表时间2010
- DOI10.1117/12.862371
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