SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Design of temperature measurement system based on two-color imaging in adaptive optics of CCD
- 作者Wu, Yong-hua; Zhang, Yudong; Sasián, José; Hu, Yi-hua; Jiang, Fei; Xiang, Libin; Zhang, Lin-hu; To, Sandy
- 卷第7656卷
- 印刷ISSN0277-786X
- 文件大小304.94KB
- 发表时间2010
- DOI10.1117/12.865571
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