SPIE Proceedings [SPIE Laser Damage Symposium XLII: Annual Symposium on Optical Materials for High Power Lasers - Boulder, Colorado (Sunday 26 September 2010)] Laser-Induced Damage in Optical Materials: 2010 - Submicrometer-resolution mapping of ultraweak 355-nm absorption in HfO 2 monolayers using photothermal heterodyne imaging
- 作者Papernov, S.; Exarhos, Gregory J.; Gruzdev, Vitaly E.; Tait, A.; Bittle, W.; Menapace, Joseph A.; Ristau, Detlev; Schmid, A. W.; Oliver, J. B.; Soileau, M. J.; Kupinski, P.
- 卷第7842卷
- 印刷ISSN0277-786X
- 文件大小6657.99KB
- 发表时间2010
- DOI10.1117/12.868236
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Front Matter: Volume 7655SPIE, Proceedings of; Yang, Li; Namba, Yoshiharu; Walker, David D.; Li, Shengyi · 2010
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes - Front Matter for Volume 7654SPIE, Proceedings of; Jiang, Wenhan; Cho, Myung K.; Wu, Fan · 2010
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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes - <title>Athermalization of coaxial reflective space telescope</title>Lei, Zhang; Guang, Jin; Jiang, Wenhan; Cho, Myung K.; Wu, Fan · 2010
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Designs of masks in thickness uniformityJaing, Cheng-Chung; Yang, Li; Namba, Yoshiharu; Walker, David D.; Li, Shengyi · 2010
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Ultraprecision machining of nitrocarburized steelsOsmer, J.; Yang, Li; Namba, Yoshiharu; Gläbe, R.; Riemer, O.; Walker, David D.; Li, Shengyi; Brinksmeier, E. · 2010
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Stray radiation research in CSRSDu, Baolin; Yang, Li; Namba, Yoshiharu; Li, Lin; Huang, Yifan; Walker, David D.; Li, Shengyi; Han, Xing; Ma, Bin · 2010
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes - Blind deconvolution in phased telescope arrayZhou, Zhiwei; Jiang, Wenhan; Cho, Myung K.; Wang, Dayong; Wang, Yunxin; Wu, Fan; Wan, Yuhong · 2010