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Electron holography for analysis of deep submicron devices: Present status and challenges

Electron holography for analysis of deep submicron devices: Present status and challenges

Ikarashi, Nobuyuki; Toda, Akio; Uejima, Kazuya; Yako, Koichi; Yamamoto, Toyoji; Hane, Masami; Sato, Hiroshi
  • 期刊名称Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
  • 作者Ikarashi, Nobuyuki; Toda, Akio; Uejima, Kazuya; Yako, Koichi; Yamamoto, Toyoji; Hane, Masami; Sato, Hiroshi
  • 卷第28卷
  • 期第1期
  • 印刷ISSN2166-2746
  • 电子ISSN2166-2754
  • 文件大小680.32KB
  • 发表时间2010-01
  • DOI10.1116/1.3207964
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