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Hot-carrier stress induced degradation in Multi-STI-Finger LDMOS: An experimental and numerical insight

Hot-carrier stress induced degradation in Multi-STI-Finger LDMOS: An experimental and numerical insight

S. Poli; S. Reggiani; G. Baccarani; E. Gnani; A. Gnudi; M. Denison; S. Pendharkar; R. Wise
  • 作者S. Poli; S. Reggiani; G. Baccarani; E. Gnani; A. Gnudi; M. Denison; S. Pendharkar; R. Wise
  • 印刷ISSN0038-1101
  • 文件大小789.59KB
  • 发表时间2011
  • DOI10.1016/j.sse.2011.06.007
  • 页码57-63
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