Reproducible resistance switching of defect-engineered NiOx with metallic Nb impurity
- 作者Jonggi Kim; Heedo Na; Sunghoon Lee; Kyumin Lee; Jung-Ho Yoo; Dae-Hong Ko; Hyunchul Sohn
- 卷第519卷
- 期第22期
- 印刷ISSN0040-6090
- 文件大小822.25KB
- 发表时间2011
- DOI10.1016/j.tsf.2011.05.074
- 页码8119-8124
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