Causes of School Bullying: Empirical Test of a General Theory of Crime, Differential Association Theory, and General Strain Theory
- 期刊名称Crime & Delinquency
- 作者Moon, B.; Hwang, H.-W.; McCluskey, J. D.
- 卷第57卷
- 期第6期
- 印刷ISSN0011-1287
- 电子ISSN1552-387X
- 文件大小344.43KB
- 发表时间2011-11-01
- DOI10.1177/0011128708315740
- 页码849-877
The centennial of the Institute: American Institute of Electrical Engineers — AIEE: Institute of Electrical and Electronics Engineers — IEEEIEEE Transactions on Reliability · 1984
The Institute of Electrical and Electronics Engineers1963
INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERSINC. 1972 INTERNATIONAL CONFERENCE ON COMMUNICATIONS · 2222
Institute of Electrical and Electronics Engineers, Inc.IEEE Microwave Magazine · 2007
[IEEE Proceedings The Institute of Electrical and Electronics Engineers. 29th Annual 1995 International Carnahan Conference on Security Technology - Sanderstead, UK (1995.10.18-1995.10.20)] Proceedings The Institute of Electrical and Electronics Engineers 29th Annual 1995 International Carnahan Conference on Security Technology CCST-95 - Proceedings The Institute of Electrical and Electronics Engineers. 29th Annual 1995 International Carnahan Conference on Security Technology1995
[IEEE Proceedings. Institute of Electrical and Electronics Engineers 1988 International Carnahan Conference on Security Technology, Crime Countermeasures - Lexington, KY, USA (1988.10.5-1988.10.7)] Proceedings. Institute of Electrical and Electronics Engineers 1988 International Carnahan Conference on Security Technology, Crime Countermeasures - Proceedings. The Institute of Electrical and Electronics Engineers 1988 International Carnahan Conference on Security Technology: Crime Countermeasures (Cat. No.88CH2645-0)1988
The Institute of Electrical and Electronics Engineers, Inc.1985
The Institute of Electrical and Electronics Engineers, Inc.1985