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Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - study on overshoot waveform in an actual test circuit

Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - study on overshoot waveform in an actual test circuit

Ueta, G.; Tsuboi, T.; Okabe, S.

作者Ueta, G.; Tsuboi, T.; Okabe, S.
卷第18卷
期第3期
印刷ISSN1070-9878
文件大小603.58KB
发表时间2011
DOI10.1109/tdei.2011.5931066
页码783-791

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